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Oxide Reliability: A Summary of Silicon Oxide Wearout, Breakdown, and Reliability

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AuthorDumin D J
ISBN9789810248420
Published LanguageEnglish
Publication Year2002
PublisherWorld Scientific
BindingHardback
Original Price$129
Pages280
Ships By2-3 days
SKU: WS-2581 Categories: ,

Description

This book presents in summary the state of our knowledge of oxide reliability. The articles have been written by experts who are among the most knowledgeable in the field. The book will be an invaluable aid to reliability engineers and manufacturing engineers, helping them to produce and characterize reliable oxides. It can be used as an introduction for new engineers interested in oxide reliability, besides being a reference for engineers already engaged in the field.

About the author
Clemson Univ, USA

Additional information

Weight0.643 kg
Author

ISBN

Publisher

Pages

280

Ships By

2-3 days