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Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging and Analysis

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AuthorTanaka Nobuo
ISBN9781848167896
Published LanguageEnglish
Publication Year2014
PublisherWorld Scientific
BindingHardback
Original Price$155
Pages616
Ships By2-3 days

Description

The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.

About the author
Nagoya Univ, Japan

Additional information

Weight1.085 kg
Dimensions22.9 × 15.2 cm
Author

ISBN

Publisher

Pages

616

Ships By

2-3 days