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X-Ray Scattering From Semiconductors and Other Materials (3rd Edition)

7667.000

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AuthorFewster Paul F
ISBN9789814436922
Published LanguageEnglish
Publication Year2015
PublisherWorld Scientific
BindingHardback
Original Price$119
Pages512
Ships By2-3 days

Description

This third edition has been extended considerably to incorporate more information on instrument influences on the interpretation of X-ray scattering profiles and reciprocal space maps. Another significant inclusion is on the scattering from powder samples, covering a new theoretical approach that explains features that conventional theory cannot. The new edition includes some of the latest methodologies and theoretical treatments, including the latest thinking on dynamical theory and diffuse scattering. Recent advances in detectors also present new opportunities for rapid data collection and some very different approaches in data collection techniques; the possibilities associated with these advances will be included.

This edition should be of interest to those who use X-ray scattering to understand more about their samples, so that they can make a better judgment of the parameter and confidence levels in their analyses, and how the combination of instrument, sample and detection should be considered as a whole to ensure this.

About the author
Panalytical Research, UK

Additional information

Weight0.872 kg
Dimensions22.9 × 15.2 cm
Author

ISBN

Publisher

Pages

512

Ships By

2-3 days