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  $Strain and Dislocation Gradients From Diffraction: Spatially-Resolved Local Structure and Defects$ Quick View
- Electron Microscopy, Materials Science, Scanning, Tunnelling
- Strain and Dislocation Gradients From Diffraction: Spatially-Resolved Local Structure and Defects
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- Electron Microscopy, Materials Science, Scanning, Tunnelling
- Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging and Analysis
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- Electron Microscopy, Materials Science, Scanning, Tunnelling
- Aberration-Corrected Imaging in Transmission Electron Microscopy: An Introduction (2nd Edition)
- Original price was: ₹9570.00.Current price is: ₹7178.00.
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